Modelling Water Treeing in XLPE Insulation using Electric Field Concepts
##plugins.themes.academic_pro.article.main##
Abstract
A methodology to model water treeing in XLPE insulation by using electric field, elastic deformation due to pressure build up inside void and probability concepts has been developed. Tree patterns have been numerically simulated considering point-plane electrode geometry in XLPE insulation. The strategy of modelling is verified by comparing fractal dimensions of simulated and experimentally generated tree patterns. The current study revealed, that presence of void filled with moisture is less harmful to presence of a metallic particle of same dimension and also the growth of bow tie tree terminates after it develops to a finite size. Depending upon the type of defects such as semi conducting particle or void filled with air etc, that is present in the insulation, further structure of the prebreakdown channel resembled electrical tree.
##plugins.themes.academic_pro.article.details##
How to Cite
Ganga, S., Moorching, S. N., & Sridhar, S. (2004). Modelling Water Treeing in XLPE Insulation using Electric Field Concepts. Power Research - A Journal of CPRI, 44–48. Retrieved from https://cprijournal.in/index.php/pr/article/view/985
References
- Ganga, S., Nagamani, H.N. and Moorching, S.N., "'Modelling Electric Treeing Xlpe Insulation Using Electric field Concepts”, 5th International Conference On Insulated Power Cables Paris, Versailles, France 20-24 June 1999.
- Mayoux, C., “Ageing of Polymeric Materials In Power Cables”, IEEE Trans. On Elect. Insul. V. 4, No. 6, Dec. 1997, pp. 665-673.
- El-Zein, A., “Analysis Of Water Treeing In Solid Insulated Cables”, IEEE Inter. Symp. On Elect. Insul. Virginia, USA, June 7-10, 1998, pp . 113-116.
- Barclay, A.L., Sweeney, PJ., Dissado, L.A. and Stevens, G.C., “Stochastic modellmg of electrical treeing: fractal and statistical characteristics”, J. Appl. Phys. 23 (1990), pp. 1536-1545.
- Wiesmann, H.J. and Zeller, H.R., “A fractal model of dielectric breakdown in solid dielectrics”, J. Appl Phys. 60(5), 1986, p p . 1770-1773.